Sources of failures and yield improvement for VLSI and restructurable interconnects for RVLSI and WSI: Part I—sources of failures and yield improvements for VLSI : Tulin Erdim Mangir. Proc. IEEE72, 690 (June 1984)

• Book ID: 103282382
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 129 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90140-4