Sources of failures and yield improvement for VLSI and reconstructable interconnects for RVLSI and WSI: Part I-sources of failures and yield improvements for VLSI: Tulin Erdim Mangir Proc. IEEE 72, 690 (June 1984)

• Book ID: 104157354
• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 94 KB
• Volume: 16
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(85)80176-2