Some issues of hot-carrier degradation and negative bias temperature instability of advanced SOI CMOS transistors

✍ Scribed by D.P. Ioannou; D.E. Ioannou

• Book ID: 108271554
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 338 KB
• Volume: 51
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2007.01.004