The study of semiconductor interfaces and of solid interfaces in general requires novel instrument capable to investigate the lateral fluctuations of properties on a microscopic scale. We present the first result of a major effort in that framework, whose main objective is the exploitation of the un
Some forensic applications of a combined micro-Raman and scanning electron microscopy system
โ Scribed by Vincent Otieno-Alego
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 384 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0377-0486
- DOI
- 10.1002/jrs.2206
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
This bibliography is compiled to assist in locating papers related to the application of scanning electron microscopy (SEM) to cerebrospinal-fluid-contacting surfaces in vertebrates. The use of SEM by neuroscientists has continued apace since the publication of the first bibliography in 1980. SEM st
Suppression of low-mass ion peaks in matrix-assisted ultraviolet laser desorption has been found to occur at low matrix-to-analyte molar ratios when using nicotinic acid as matrix, independent of the angle of illumination. Microscopic Raman scattering spectroscopy has been employed to investigate th