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Some electrical properties of solution–grown crystals of n-ZnSiP2 and p-ZnGeP2

✍ Scribed by Springthorpe, A. J. ;Monk, R. W.

Publisher
John Wiley and Sons
Year
1970
Tongue
English
Weight
206 KB
Volume
1
Category
Article
ISSN
0031-8965

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A high quality ZnGeP 2 (ZGP) single crystal 22 mm in diameter and 70 mm in length was grown by a modified vertical Bridgman method. The as-grown and annealed crystals were characterized using XRD, IR spectrophotometers, positron annihilation lifetime (PAL), Hall Effect and resistivity measurements.