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Some electrical properties of high-resistance ZnGeP2 single crystals

✍ Scribed by Grigoreva, V. S. ;Prochukhan, V. D. ;Rud, Yu. V. ;Yakovenko, A. A.


Publisher
John Wiley and Sons
Year
1973
Tongue
English
Weight
270 KB
Volume
17
Category
Article
ISSN
0031-8965

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A high quality ZnGeP 2 (ZGP) single crystal 22 mm in diameter and 70 mm in length was grown by a modified vertical Bridgman method. The as-grown and annealed crystals were characterized using XRD, IR spectrophotometers, positron annihilation lifetime (PAL), Hall Effect and resistivity measurements.