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Soft breakdown conduction in ultrathin (3-5 nm) gate dielectrics

✍ Scribed by Miranda, E.; Sune, J.; Rodriguez, R.; Nafria, M.; Aymerich, X.; Fonseca, L.; Campabadal, F.

Book ID: 114537995
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 190 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.817571

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