Skin-effect resistance of conductors wit
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J. Guo; A. W. Glisson; D. Kajfez
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Article
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1998
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John Wiley and Sons
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English
⚖ 102 KB
Figure 3 Inverse quality factor calculated using the FDTD program as a function of the device radius optical model is able to analyze complex VCSEL structures, and to generate the eigenfrequencies, power spectra, spatial distribution, and quality factor of the cavity modes. The key issues for the d