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Skin-effect resistance of conductors with a trapezoidal cross section

✍ Scribed by J. Guo; A. W. Glisson; D. Kajfez

Publisher: John Wiley and Sons
Year: 1998
Tongue: English
Weight: 102 KB
Volume: 18
Category: Article
ISSN: 0895-2477
DOI: 10.1002/(sici)1098-2760(19980820)18:6<387::aid-mop7>3.0.co;2-9

No coin nor oath required. For personal study only.

✦ Synopsis

Figure 3 Inverse quality factor calculated using the FDTD program as a function of the device radius

optical model is able to analyze complex VCSEL structures, and to generate the eigenfrequencies, power spectra, spatial distribution, and quality factor of the cavity modes. The key issues for the design of single-mode VCSELs that are addressed by this analysis are the quality factors of individual modes which may be used to study transverse mode discrimination. Future plans include the analysis of the optical properties of various complex structures such as selectively oxidized VCSELs.

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