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Size Is in the Eye of the Beholder: Technique for Nondestructive Detection of Parameterized Defects

โœ Scribed by Calvano, F.; Raumonen, P.; Suuriniemi, S.; Kettunen, L.; Rubinacci, G.


Book ID
114654057
Publisher
IEEE
Year
2010
Tongue
English
Weight
251 KB
Volume
46
Category
Article
ISSN
0018-9464

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