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Size dependence of creep behavior in nanoscale Cu/Co multilayer thin films

✍ Scribed by X.Y. Zhu; J.T. Luo; G. Chen; F. Zeng; F. Pan

Book ID: 116607209
Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 516 KB
Volume: 506
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2010.07.024

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