A new procedure for nonlinear statistica
โ
Francesco Centurelli; Alberto Di Martino; Giuseppe Scotti; Pasquale Tommasino; A
๐
Article
๐
2003
๐
John Wiley and Sons
๐
English
โ 320 KB
A new statistical nonlinear model of GaAs FET MMICs which allows the representation of distance-dependent technological parameter variations by means of equivalent circuit parameters, and an automatic extraction procedure, are presented. The capability to reproduce statistical distribution has been