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Single transducer swept frequency ultrasonic reflection measurements


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
337 KB
Volume
17
Category
Article
ISSN
0041-624X

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Reflection and transmission ellipsometry
✍ F. Sagnard; D. Seetharamdoo; V. Le Glaunec πŸ“‚ Article πŸ“… 2002 πŸ› John Wiley and Sons 🌐 English βš– 254 KB

## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50Β°]. Original numerical me