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Single Event Upsets in NMOS Microprocessors

✍ Scribed by Guenzer, C. S.; Campbell, A. B.; Shapiro, P.

Book ID: 114662242
Publisher: IEEE
Year: 1981
Tongue: English
Weight: 653 KB
Volume: 28
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.1981.4335654

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