Full temperature single event upset characterization of two microprocessor technologies

✍ Scribed by Nichols, D.K.; Coss, J.R.; Smith, L.S.; Rax, B.; Huebner, M.; Watson, K.

• Book ID: 114554645
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 255 KB
• Volume: 35
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/23.25508