✦ LIBER ✦

Single Event Upset Sensitivity of Low Power Schottky Devices

✍ Scribed by Price, W. E.; Nichols, D. K.; Measel, P. R.; Wahlin, K. L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

mubeam system for study of single event

✍ T. Kamiya; N. Utsunomiya; E. Minehara; R. Tanaka; I. Ohdomari 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 727 KB

Low energy single event upset/single eve

✍ Fazeli, M.; Miremadi, S.G.; Ejlali, A.; Patooghy, A. 📂 Article 📅 2009 🏛 The Institution of Engineering and Technology 🌐 English ⚖ 355 KB

Single Event Upset (SEU) of Semiconducto

✍ Nichols, Donald K.; Price, William E.; Malone, Carl J. 📂 Article 📅 1983 🏛 IEEE 🌐 English ⚖ 985 KB

In-flight and ground testing of single e

✍ Johansson, K.; Dyreklev, P.; Granbom, O.; Calver, M.C.; Fourtine, S.; Feuillatre 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 461 KB

Low-overhead single-event upset hardened

✍ She, X.; Li, N. 📂 Article 📅 2010 🏛 The Institution of Engineering and Technology 🌐 English ⚖ 377 KB

Heavy ion linear energy transfer measure

✍ Zajic, V.; Thieberger, P. 📂 Article 📅 1999 🏛 IEEE 🌐 English ⚖ 276 KB