Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

✍ Scribed by Allen, Gregory; Edmonds, Larry D.; Swift, Gary; Carmichael, Carl; Tseng, Chen Wei; Heldt, Kevin; Anderson, Scott Arlo; Coe, Michael

• Book ID: 126695282
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 154 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2011.2105282