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A Comprehensive Methodology for Complex Field Programmable Gate Array Single Event Effects Test and Evaluation

✍ Scribed by Berg, M.D.; LaBel, K.A.; Hak Kim; Friendlich, M.; Phan, A.; Perez, C.


Book ID
114663785
Publisher
IEEE
Year
2009
Tongue
English
Weight
869 KB
Volume
56
Category
Article
ISSN
0018-9499

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