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Single event Simulation methodology for analog/mixed signal design hardening

โœ Scribed by Kauppila, J.S.; Massengill, L.W.; Holman, W.T.; Kauppila, A.V.; Sanathanamurthy, S.


Book ID
120837658
Publisher
IEEE
Year
2004
Tongue
English
Weight
410 KB
Volume
51
Category
Article
ISSN
0018-9499

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A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controlla