Single Event Effect Characterization of High Density Commercial NAND and NOR Nonvolatile Flash Memories

✍ Scribed by Irom, Farokh; Nguyen, Duc N.

• Book ID: 126514740
• Publisher: IEEE
• Year: 2007
• Tongue: English
• Weight: 256 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2007.909984