SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

✍ Scribed by Oldham, T. R.; Ladbury, R. L.; Friendlich, M.; Kim, H. S.; Berg, M. D.; Irwin, T. L.; Seidleck, C.; LaBel, K. A.

• Book ID: 120992914
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 172 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2006.885843