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Single-crystal time-of-flight neutron diffraction of Cr3Si and MnF2 comparison with monochromatic-beam techniques

✍ Scribed by Jauch, W. ;Schultz, A. J. ;Heger, G.

Book ID
114500045
Publisher
International Union of Crystallography
Year
1987
Tongue
English
Weight
348 KB
Volume
20
Category
Article
ISSN
0021-8898

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