Sinewave fit algorithm based on total least-squares method with application to ADC effective bits measurement

✍ Scribed by Jian Qiu Zhang; Zhao Xinmin; Hu Xiao; Sun Jinwei

• Book ID: 114543845
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 151 KB
• Volume: 46
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/19.650821