Sinewave fit algorithm based on total least-squares method with application to ADC effective bits measurement

✍ Scribed by Jian Qiu Zhang; Zhao Xinmin; Hu Xiao; Sun Jinwei

• Book ID: 114288935
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 43 KB
• Volume: 21
• Category: Article
• ISSN: 0920-5489
• DOI: 10.1016/s0920-5489(99)91978-5