Simultaneous optical measurement of Ge content and Boron doping in strained epitaxial films using a novel data-analysis technique

✍ Scribed by Stephen Morris; Paul Fougeres; Stéphanie Bozzo-Escoubas; Sylvie Bodnar; Stephane Gaillard

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 255 KB
• Volume: 8
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2004.09.040