Use of ellipsometry and gravimetry to de
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Parbhoo, B.; Izrael, S.; Salamanca, J. M.; Keddie, J. L.
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Article
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2000
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John Wiley and Sons
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English
⚖ 73 KB
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There are important technological and scientific needs for accurate and precise measurements of the weight and thickness of silicone coatings, which are used in wide-ranging applications. X-ray fluorescence (XRF) spectroscopy offers one means of achieving such measurements. Here we show that, as pre