Simultaneous extraction of hole barrier height and interfacial oxide thickness of polysilicon-emitter bipolar transistors

✍ Scribed by O.W. Purbo; C.R. Selvakumar

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 554 KB
• Volume: 34
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(91)90227-p