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Simultaneous extraction of hole barrier height and interfacial oxide thickness of polysilicon-emitter bipolar transistors : O. W. Purbo and C. R. Selvakumar. Solid-St. Electron.34(8), 821 (1991)


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
125 KB
Volume
32
Category
Article
ISSN
0026-2714

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