Simultaneous extraction of hole barrier height and interfacial oxide thickness of polysilicon-emitter bipolar transistors : O. W. Purbo and C. R. Selvakumar. Solid-St. Electron.34(8), 821 (1991)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 125 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90600-p