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Simulation of thin film growth and in situ characterization by RHEED and photoemission

✍ Scribed by M Djafari Rouhani; N Fazouan; AM Gue; D Estève

Book ID
107868926
Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
407 KB
Volume
46
Category
Article
ISSN
0042-207X

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