𝔖 Bobbio Scriptorium

✦ LIBER ✦

Simulation of Semiconductor Processes and Devices 2007 || Statistical Compact Model Parameter Extraction Strategy for Intrinsic Parameter Fluctuation

✍ Scribed by Grasser, Tibor; Selberherr, Siegfried

Book ID: 121418488
Publisher: Springer Vienna
Year: 2007
Weight: 450 KB
Category: Article
ISBN: 3211728600
DOI: 10.1007/978-3-211-72861-1_72

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[Japan Soc. Appl. Phys 2002 Internationa

[Japan Soc. Appl. Phys 2002 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2002) - Kobe, Japan (4-6 Sept. 2002)] International Conferencre on Simulation of Semiconductor Processes and Devices - On the large-signal CMOS modeling and parameter extraction for RF applications

✍ Minkyu Je, ; Ickjin Kwon, ; Jeonghu Han, ; Hyungcheol Shin, ; Kwyro Lee, 📂 Article 📅 2002 🏛 Japan Soc. Appl. Phys 🌐 Japanese ⚖ 259 KB

[IEEE 2009 International Conference on S

[IEEE 2009 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - San Diego, CA, USA (2009.09.9-2009.09.11)] 2009 International Conference on Simulation of Semiconductor Processes and Devices - Monte Carlo-Based Analytical Models for Electron and Hole Electrical Parameters in Strained SiGeC Alloys

✍ Michaillat, Marc; Rideau, Denis; Aniel, Frederic; Tavernier, Clement; Jaouen, He 📂 Article 📅 2009 🏛 IEEE ⚖ 474 KB