In this article a method is presented for evaluating the probability of detecting (PD) a single stuck-fault in a sequential circuit as a function of the number of random input test vectors. A discrete parameter Markovmodel is used in the analysis to obtain closed-form expressions for PD. The circuit
โฆ LIBER โฆ
Simulation error in the probability estimate of a random event
โ Scribed by A. O. Bogush
- Publisher
- Springer US
- Year
- 1994
- Tongue
- English
- Weight
- 582 KB
- Volume
- 30
- Category
- Article
- ISSN
- 1573-8337
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