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Simulating the modulation response of VCSELs: the effects of diffusion capacitance and spatial hole-burning

✍ Scribed by Liu, Y.; Ng, W.-C.; Oyafuso, F.; Klein, B.; Hess, K.

Book ID
114455938
Publisher
The Institution of Electrical Engineers
Year
2002
Tongue
English
Weight
813 KB
Volume
149
Category
Article
ISSN
1350-2433

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