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Simplified test method for the d-axis transient reactance and time constant

✍ Scribed by Yohe, C. F.

Book ID: 125886405
Publisher: Institute of Electrical and Electronics Engineers
Year: 1956
Weight: 251 KB
Volume: 74
Category: Article
ISSN: 0097-2185
DOI: 10.1109/TAI.1956.6367125

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