[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - The power grid transient simulation in linear time based on 3D alternating-direction-implicit method

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - RTOS modeling for system level design

✍ Gerstlauer, A.; Haobo Yu, ; Gajski, D.D. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 261 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Timing verification with crosstalk for transparently latched circuits

✍ Hai Zhou, 📂 Article 📅 2003 🏛 IEEE Comput. Soc ⚖ 280 KB

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - A new approach to test generation and test compaction for scan circuits

✍ Pomeranz, I.; Reddy, S.M. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 241 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - SPIN: a scalable, packet switched, on-chip micro-network

✍ Adriahantenaina, A.; Charlery, H.; Greiner, A.; Mortiez, L.; Zeferino, C.A. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 233 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Masking the energy behavior of DES encryption [smart cards]

✍ Saputra, H.; Vijaykrishnan, N.; Kandemir, M.; Irwin, M.J.; Brooks, R.; Kim, S.; 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 391 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s

[IEEE Comput. Soc 6th Design Automation

[IEEE Comput. Soc 6th Design Automation and Test in Europe (DATE 03) - Munich, Germany (3-7 March 2003)] 2003 Design, Automation and Test in Europe Conference and Exhibition - Reducing power consumption for high-associativity data caches in embedded processors

✍ Nicolaescu, D.; Veidenbaum, A.; Nicolau, A. 📂 Article 📅 2003 🏛 IEEE Comput. Soc 🌐 English ⚖ 265 KB

The two volumes of this proceedings (of the Design, Automation, and Test in Europe Conference held in Munich, Germany in March 2003) feature the designers' forum in v.1 and nearly 1200 pages of proceedings in v.2. Among the topics of the designers' forum are design case studies, embedded operating s