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Simplified preparation of thin films and foils for TEM

โœ Scribed by G. Heckmus

Book ID
107827865
Publisher
Elsevier Science
Year
1970
Weight
514 KB
Volume
3
Category
Article
ISSN
0026-0800

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Plan view TEM sample preparation for non
Plan view TEM sample preparation for non-continuous and delaminating thin films
โœ Weaver, Louise ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 102 KB

The preparation of plan view samples for TEM examination is generally a straightforward process except where the film delaminates from the substrate or is non-continuous. A method is described where film is first stabilised using an epoxy, then transferred to an aperature grid and ion milled to prod

Influence of material properties on TEM
Influence of material properties on TEM specimen preparation of thin films
โœ Madsen, Lynnette D.; Weaver, Louise; Jacobsen, Sissel N. ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 94 KB ๐Ÿ‘ 2 views

Several factors must be taken into account when deciding which specimen preparation technique(s) to use. These factors include the amount of material available, ease of preparing this material due to its properties and familiarity, location and size of the region of interest, amount of information s