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Simple Model for Surface Ionization in Electron Probe Microanalysis

✍ Scribed by S. Segui; J. Trincavelli; G. Castellano; J. Riveros

Book ID
111989682
Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
331 KB
Volume
25
Category
Article
ISSN
0049-8246

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πŸ“œ SIMILAR VOLUMES

Application of the Pontriaguin Method to
Application of the Pontriaguin Method to a Simple Model for Electron Probe Microanalysis
✍ M. Villafuerte; S. Heluani; H. Brizuela; C. Hoffmann πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 183 KB πŸ‘ 2 views

An analytical expression for the characteristic line intensity of the x-rays emitted by a probe when bombarded by an electron beam is obtained using the Pontriaguin method. This method is applied to a simple model which is brieΓ‘y described.