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Silicon nitride windows for electron microscopy of whole cells

โœ Scribed by E. A. RING; D. B. PECKYS; M. J. DUKES; J. P. BAUDOIN; N. DE JONGE

Book ID
108866917
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
408 KB
Volume
243
Category
Article
ISSN
0022-2720

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Transmission electron microscopy studies
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โœ Pink, Francis X. ;Ostreicher, Kim J. ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 713 KB

Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide