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Electron microscopy of oxidized silicon nitride

โœ Scribed by J. V. Sharp

Publisher
Springer
Year
1973
Tongue
English
Weight
884 KB
Volume
8
Category
Article
ISSN
0022-2461

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๐Ÿ“œ SIMILAR VOLUMES

Transmission electron microscopy studies
Transmission electron microscopy studies of plasma-etched silicon nitride/silicon carbide composites
โœ Pink, Francis X. ;Ostreicher, Kim J. ๐Ÿ“‚ Article ๐Ÿ“… 1987 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 713 KB

Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide