Electron microscopy study of the microstructure of a hot-pressed silicon nitride
โ Scribed by T. Epicier; G. Orange
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 159 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0272-8842
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๐ SIMILAR VOLUMES
Transmission electron microscopy has been used to isolate and examine the intergranular glass phase in hot-pressed silicon nitride/silicon carbide composites. Previously there have been difficulties in locating a suitable region for studies of this nature because the interfering nitride and carbide
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