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Significant minority carrier lifetime improvement in red edge zone in n-type multicrystalline silicon

✍ Scribed by Vähänissi, Ville; Yli-Koski, Marko; Haarahiltunen, Antti; Talvitie, Heli; Bao, Yameng; Savin, Hele

Book ID: 120079312
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 662 KB
Volume: 114
Category: Article
ISSN: 0927-0248
DOI: 10.1016/j.solmat.2013.02.026

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