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Minority carrier lifetime enhancement in multicrystalline silicon by means of a dual treatment based on porous silicon and sputter-deposition of TiO2:Cr passivation layers

✍ Scribed by A. Hajjaji; M. Ben Rabha; N. Janene; M. Gaidi; B. Bessais; M.A. El Khakani


Book ID
116245303
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
301 KB
Volume
258
Category
Article
ISSN
0169-4332

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