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Si/Gex Si1−x heterojunction bipolar transistors formed by Ge ion implantation in Si. Narrowing of band gap and base width

✍ Scribed by S. Lombardo; C. Spinella; S.U. Campisano; A. Pinto; P. Ward


Book ID
114170565
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
180 KB
Volume
147
Category
Article
ISSN
0168-583X

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