A proposal of new floating-dot memory st
โ
Tatsuya Usuki; Toshiro Futatsugi; Naoki Yokoyama
๐
Article
๐
1999
๐
Elsevier Science
๐
English
โ 238 KB
We analytically investigate the trade-off between write errors caused by thermal fluctuation and the required number of electrons for floating-dot memory. Our evaluation shows that more than 7 electrons are necessary to maintain writing reliability in memory cells on the scale of ten-nanometers at r