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Si memory device operated with a small number of electrons by using a single-electron-transistor detector

โœ Scribed by Takahashi, Y.; Fujiwara, A.; Yamazaki, K.; Namatsu, H.; Kurihara, K.; Murase, K.


Book ID
121231263
Publisher
The Institution of Electrical Engineers
Year
1998
Tongue
English
Weight
294 KB
Volume
34
Category
Article
ISSN
0013-5194

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We analytically investigate the trade-off between write errors caused by thermal fluctuation and the required number of electrons for floating-dot memory. Our evaluation shows that more than 7 electrons are necessary to maintain writing reliability in memory cells on the scale of ten-nanometers at r