Short-Term Anneal of 30-MeV Electron Damage in High-Purity n-Type Silicon

✍ Scribed by Mallon, C. E.; Naber, J. A.

• Book ID: 117928523
• Publisher: IEEE
• Year: 1970
• Tongue: English
• Weight: 787 KB
• Volume: 17
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1970.4325778