Comment on "Short-Term Anneal of 30-MeV Electron Damage in High-Purity n-Type Silicon"

• Book ID: 117928928
• Publisher: IEEE
• Year: 1972
• Tongue: English
• Weight: 300 KB
• Volume: 19
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1972.4326614