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SHI induced surface modification studies of HOPG using STM

โœ Scribed by A. Tripathi; S.A. Khan; M. Kumar; V. Baranwal; R. Krishna; A.C. Pandey


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
289 KB
Volume
244
Category
Article
ISSN
0168-583X

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Ion irradiation induced surface modifica
โœ A. Tripathi; Amit Kumar; F. Singh; D. Kabiraj; D.K. Avasthi; J.C. Pivin ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 371 KB

Various types of scanning probe microscopy (SPM) techniques: atomic force microscopy (AFM) (contact and tapping in height and amplitude mode), scanning tunnelling microscopy (STM) and conducting atomic force microscopy (C-AFM) are used for studying ion beam induced surface modifications, nanostructu