Shape memory effect-induced crack closure in Si thin film deposited on a Ti–50.3Ni (at%) alloy substrate

✍ Scribed by Gyu-bong Cho; Bo-min Kim; Hee-jin Choi; Jung-pil Noh; Si-young Choi; Hyo-jun Ahn; Shuichi Miyazaki; Tae-hyun Nam

• Book ID: 116607311
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 554 KB
• Volume: 507
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/j.jallcom.2010.07.136