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Set-theoretic estimation based on a priori knowledge of the noise distribution

✍ Scribed by Kuo, C.J.; Deller, J.R., Jr.; Lin, C.Y.; Tsai, Y.C.


Book ID
118690729
Publisher
IEEE
Year
2000
Tongue
English
Weight
177 KB
Volume
48
Category
Article
ISSN
1053-587X

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## Abstract A new method for the determination of a distributed FET noise model is presented. It is based on the extraction of the intrinsic noise‐correlation matrix of an elemental section of the device from the device's noise figure, measured for only one source‐impedance state at a number of fre