Sequential Circuits with Combinational Test Generation Complexity under Single-Fault Assumption

✍ Scribed by Michiko Inoue; Emil Gizdarski; Hideo Fujiwara

• Book ID: 110323546
• Publisher: Springer US
• Year: 2002
• Tongue: English
• Weight: 86 KB
• Volume: 18
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1023/a:1013728006805