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Separation of surface and bulk components in MOS-C generation rate measurements

✍ Scribed by D.W. Small; R.F. Pierret

Publisher: Elsevier Science
Year: 1976
Tongue: English
Weight: 739 KB
Volume: 19
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(76)90015-0

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